发明名称 Micrometer adjustable backgauge
摘要 A backgauge locator which provides manual adjustment of the backgauge relative to the die elements of a machine tool press brake. When used in pairs, each probe tip is contiguous with the outer edge of the workpiece to prevent parallel misalignment. The body is slideably attached to the machine tool backgauge to compensate for varying widths of the workpiece having an over-center spring loaded cam for manual positioning. A probe is pivotally located in the body and spring loaded to engage a micrometer head providing controlled linear movement. The probe pivots upward to allow for secondary bends of the workpiece without damaging the precision micrometer head and the tension spring also acts as a return mechanism to reposition the probe when the workpiece is removed.
申请公布号 US4420890(A) 申请公布日期 1983.12.20
申请号 US19820350718 申请日期 1982.02.22
申请人 NAYLOR, NELSON A. 发明人 NAYLOR, NELSON A.
分类号 G01B3/18;G01B5/02;(IPC1-7):G01B5/02;B21D11/22 主分类号 G01B3/18
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