发明名称 DRY ETCHING METHOD
摘要 PURPOSE:To dry-etch a sample with high safety and at low cost without using a special etchent gas by disposing an organic high molecular material containing fluorine into a chamber, applying a high-frequency electric field and electrolytically dissociating a gas in the chamber. CONSTITUTION:A Teflon sheet 12 is disposed over the whole region of the surface of an etching electrode 8. The sample 10 is placed onto the Teflon sheet 12. When ions i collide with the sheet 12, fluorine (fluorine radicals) F* activated is generated from the sheet 12, and etches SiO2, etc. An etching rate can also be adjusted when high-frequency energy charged is altered. Substances, which can be dry-etched by a Freon group gas, such as SiO2, Si, Cr2O3, etc. are used as blanks which can be etched through the method, but a photoresist cannot be used as a mask material when air is introduced.
申请公布号 JPS58170018(A) 申请公布日期 1983.10.06
申请号 JP19820052827 申请日期 1982.03.31
申请人 FUJITSU KK 发明人 FUJIWARA HIDEKI;MAJIMA NIWAJI
分类号 H01L21/302;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):01L21/302 主分类号 H01L21/302
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