发明名称 A PHOTOMASK AND METHOD OF FABRICATING SAME.
摘要 <p>A photomask (30) used to form patterns on a resist coated semiconductor wafer is comprised of a transparent baseplate (31) having a thin metallic pattern (32) thereon; a transparent, planar coverplate (33) in intimate contact with the patterned baseplate (31) and an index matching fluid (34) interposed therebetween.</p>
申请公布号 EP0068012(A4) 申请公布日期 1983.07.04
申请号 EP19820900445 申请日期 1981.12.17
申请人 WESTERN ELECTRIC COMPANY, INCORPORATED 发明人 BANKS, EDWARD LAWRENCE;TRUAX, BRUCE EDWARD;WATKINS, LAURENCE SHRAPNELL
分类号 G03F1/48;(IPC1-7):B32B3/22;B32B31/06;G03C5/00 主分类号 G03F1/48
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