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发明名称
METHOD AND INSTRUMENT FOR MEASURING CHANGE IN TRANSIENT CAPACITY OF SEMICONDUCTING ELEMENTS
摘要
申请公布号
HU181136(B)
申请公布日期
1983.06.28
申请号
HU19800001439
申请日期
1980.06.07
申请人
MTA MUESZAKI FIZIKAI KUTATO INTEZETE,HU
发明人
FERENCZI,GYOERGY,HU;HORVATH,PETER,HU;TOTH,FERENC,HU;KISS,JOZSEF,HU;BODA,JANOS,HU
分类号
G01R31/26;H01L21/66;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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