发明名称 FORMATION OF NITRIDE FILM
摘要 PURPOSE:To quickly obtain a high quality nitride film by generating plasma by applying a high frequency power after providing an Si substrate to the one of the parallel electrodes and by using a DC negative bias due to a difference of mobilities between ion and electron. CONSTITUTION:An N2 is introduced 20 into a chamber 12, a high frequency voltage is applied from a high frequency power supply 19 to the upper electrode 13 during exhaustion 21 in order to realize grow discharge. A DC negative bias to be applied to the Si substrate 17 on the lower electrode 14 is changed by adjusting the matching boxes 16, 16'. While a substrate temperature is kept at 700-800 deg.C, film forming rate is accelerated and thermal adverse effect is avoided. According to this constitution, charge up which causes dielectric breakdown can be prevented and a nitride film having high film quality can be formed quickly.
申请公布号 JPS5893242(A) 申请公布日期 1983.06.02
申请号 JP19810190639 申请日期 1981.11.30
申请人 TOKYO SHIBAURA DENKI KK 发明人 SHIBAGAKI MASAHIRO;TAKEUCHI HIROSHI
分类号 H01L21/318;(IPC1-7):01L21/318 主分类号 H01L21/318
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