OPTICAL CHARACTERISTIC MEASURING APPARATUS FOR OPTICAL SYSTEM

摘要

PURPOSE:To measure the optical characteristics of an optical system to be inspected by detecting such a light source pattern that light emitted from a surface light source comprising an array of light emitting elements passes through a light source pattern made up of two lines intersects on a mask to form a beam parallel to the optical axis in the optical system. CONSTITUTION:Light LB0 from a specified position of a surface light source S comprising a two-dimensional array of light emitting elements S1-Sn passes through patterns A and B of lines intersecting on a mask M to form beams parallel to the optical axis OA through a lens T to be inspected so that it will be detected with a light detecting element D passing through a pin hole PH arranged at the focus point of a condenser lens CL. Such beam is contained in the mass of straight lines passing through the patterns on the mask M from the focus of the lens T and focal lines F1 and F2. Patterns A' and B' on the light source S are detected with a luminous scanning signal thereof and a light detecting element D to determine optical characteristics of the lens T.