发明名称 Deposition monitor and control system
摘要 Method and apparatus for monitoring the deposition of a material or materials upon a substrate using atomic absorption techniques. Radiant energy is directed through a flow of evaporant during a deposition process. The radiation contains spectral emission lines absorbable by the evaporant as well as emission lines not absorbable by the evaporant. Changes in the transmission of one or more non-absorbable lines are used to compensate for changes in the absorption of absorbable lines of interest that are caused by misalignment or displacement of the optical elements during the deposition process.
申请公布号 US4381894(A) 申请公布日期 1983.05.03
申请号 US19800204644 申请日期 1980.11.06
申请人 INFICON LEYBOLD-HERAEUS, INC. 发明人 GOGOL, JR., CARL A.;PRINCE, ERIC T.
分类号 C23C14/54;G01N21/31;(IPC1-7):G01N21/84 主分类号 C23C14/54
代理机构 代理人
主权项
地址