| 摘要 |
In a temperature measuring circuit suitable for implementation on an integrated circuit (IC) a plurality, M, nominally unit value current sources are individually and collectively applied to a sensor such as a diode or transistor. The resulting individual VBE voltages are measured and used to form an average, VBE(AVG), of the individual voltages. The difference DELTA VBE between the voltage, VBE(TOT), resulting from application of all M current sources and VBE(AVG) is used to solve for temperature in a relationship that is independent of the current values used. An error-corrected version of a sigma-delta analog-to-digital converter (ADC) is used to convert the analog measurements into digital signals representative of temperature.
|
