发明名称 Diode faults detecting apparatus
摘要 First and second diodes are formed on the same semiconductor substrate. Both the diodes are forward biased by a direct current power supply. An attenuator is connected to a positive terminal of the first diode to produce an output lower in level than a voltage on the positive terminal of the first diode. A comparator receives the output of the attenuator as a first input and a voltage on a positive terminal of said second diode as a second input. When the first input is smaller than the second input, the comparator produces an output "0." When the first diode is open-circuited and the first input becomes greater than the second input, the comparator produces an output "1" and detects the fault of the first diode.
申请公布号 US4346347(A) 申请公布日期 1982.08.24
申请号 US19790097494 申请日期 1979.11.26
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 KAMATA, SHOHICHI;KIMURA, YOSHINORI;HIRAI, KATSUMI
分类号 G01R31/26;(IPC1-7):G01R31/22 主分类号 G01R31/26
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