发明名称 |
Diode faults detecting apparatus |
摘要 |
First and second diodes are formed on the same semiconductor substrate. Both the diodes are forward biased by a direct current power supply. An attenuator is connected to a positive terminal of the first diode to produce an output lower in level than a voltage on the positive terminal of the first diode. A comparator receives the output of the attenuator as a first input and a voltage on a positive terminal of said second diode as a second input. When the first input is smaller than the second input, the comparator produces an output "0." When the first diode is open-circuited and the first input becomes greater than the second input, the comparator produces an output "1" and detects the fault of the first diode.
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申请公布号 |
US4346347(A) |
申请公布日期 |
1982.08.24 |
申请号 |
US19790097494 |
申请日期 |
1979.11.26 |
申请人 |
TOKYO SHIBAURA DENKI KABUSHIKI KAISHA |
发明人 |
KAMATA, SHOHICHI;KIMURA, YOSHINORI;HIRAI, KATSUMI |
分类号 |
G01R31/26;(IPC1-7):G01R31/22 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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