发明名称 Reflector optics with impedance sensing orifice
摘要 A particle analyzing apparatus comprising a reflector chamber containing an electrolyte and having a concave reflector surface with a first focus and a second focus; entraining structure, having an introduction tube for providing and moving a stream of particles suspended in an electrolyte solution through the first focus; a source of radiant energy for illuminating the particles as they pass through the first focus to produce a source of detectable radiation signals, which reflect off the concave reflector surface to be subsequently collected and analyzed; an exit tube coaxially aligned with the introduction tube; a sensing orifice mounted in the tip of the introduction tube or the exit tube; and a pair of energized electrodes disposed in the electrolyte solution on either side of the orifice, whereby the orifice creates a constricted electrical path in which the stream of particles generate electrical impedance signals as they move therethrough.
申请公布号 US4341993(A) 申请公布日期 1982.07.27
申请号 US19800181447 申请日期 1980.08.25
申请人 COULTER ELECTRONICS, INC. 发明人 BRUNSTING, ALBERT;HOGG, WALTER R.;NEWTON, WILLIAM A.
分类号 G01N15/10;G01N15/14;(IPC1-7):G01N27/00 主分类号 G01N15/10
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