发明名称 |
Reflector optics with impedance sensing orifice |
摘要 |
A particle analyzing apparatus comprising a reflector chamber containing an electrolyte and having a concave reflector surface with a first focus and a second focus; entraining structure, having an introduction tube for providing and moving a stream of particles suspended in an electrolyte solution through the first focus; a source of radiant energy for illuminating the particles as they pass through the first focus to produce a source of detectable radiation signals, which reflect off the concave reflector surface to be subsequently collected and analyzed; an exit tube coaxially aligned with the introduction tube; a sensing orifice mounted in the tip of the introduction tube or the exit tube; and a pair of energized electrodes disposed in the electrolyte solution on either side of the orifice, whereby the orifice creates a constricted electrical path in which the stream of particles generate electrical impedance signals as they move therethrough.
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申请公布号 |
US4341993(A) |
申请公布日期 |
1982.07.27 |
申请号 |
US19800181447 |
申请日期 |
1980.08.25 |
申请人 |
COULTER ELECTRONICS, INC. |
发明人 |
BRUNSTING, ALBERT;HOGG, WALTER R.;NEWTON, WILLIAM A. |
分类号 |
G01N15/10;G01N15/14;(IPC1-7):G01N27/00 |
主分类号 |
G01N15/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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