发明名称 TESTING DEVICE
摘要 PURPOSE:To perform a test with a simple circuit, by supplying the signal obtained by simulating the signal of a keyboard to a cotrol circuit. CONSTITUTION:A testing device TS is connected to an operation device A via connectors CN1 and CN2. A test controller TC supplies successively the key addresses corresponding to the data to be supplied to a controller AC based on a procedure to an input terminal of a comparator CP, and at the same time supplies a pattern corresponding the type of the pushed key of an output line OUT on a keyboard KB to a test decorder TD. The comparator CP compares a scan data supplied via a connector CN1 with the key address data, and supplies the output pattern data of the decorder TD to the controller AC via a connector NC2 in case a coincidence is obtained in the above-mentioned comparison. Thus the device A is actuated. In such way, a test is possible with a simple circuit.
申请公布号 JPS57111462(A) 申请公布日期 1982.07.10
申请号 JP19800187797 申请日期 1980.12.29
申请人 FUJITSU KK 发明人 SHIMIZU HIROMI;KOYANAGI TOMOO
分类号 G01R31/00;G01R31/317 主分类号 G01R31/00
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