| 摘要 |
<p>PURPOSE:To reduce time for design by dividing circuit elements into more than two groups and differentiating electric properties of the circuit elements and by selecting groups that show optimum properties in integrating circuits containing numeous circuit elements. CONSTITUTION:A sense amplifier blocks 71, 72 are provided with differentiated electric properties on a semiconductor substrate 1 of dynamic RAM. A dummy cell blocks 81-84 are arranged to show four different electric properties. There are eight different combinations of the dummy cells 81-84 and the sence amplifier 71, 72 on the same chip. A tester check will easily pick out the best combination of all since the eight combinations can readily be made corresponding with addresses. The combination of the best cost-per-performance can be selected with only one correction of a photo mask.</p> |
