发明名称 LOW HUMIDITY TESTING METHOD
摘要 PURPOSE:To measure the conductivity of conductors, the dielectric constant of dielectrics, etc. easily at ordinary temp. by performing measurement while flowing dry air of <=0 deg.C dew point in a measuring vessel in measuring the properties of a sample in a low humidity environment. CONSTITUTION:Air of <=0 deg.C dew point is beforehand sealed in a cylinder or the like, and a gas of a required low dew point is used according to the low humidity atmosphere required for tests. For example, dry air having -50 deg.C dew point is sealed in a bag of polyethylene in inserting a hose into the bag, and a small hole (about 3mm. diameter) is pierced in the bag, through which the dry air is flowed. If the hose is made long, the bag inside is filled with the low moisture gas of room temp. At this time, relative humidity is about 0.09% if at 30 deg.C room temp. A hair hygrometer is beforehand put in the polyethylene bag, and its humidity is measured, then a measuring sample and a measuring means are beforehand put therein, whereby the intended conductivity, etc. are measured easily. There is no need for preparing any special humidistat or the like and the use of a box or bag of good sealability suffices.
申请公布号 JPS57103037(A) 申请公布日期 1982.06.26
申请号 JP19800179747 申请日期 1980.12.18
申请人 MATSUSHITA DENKI SANGYO KK 发明人 RIYUUZAKI SHIGERU;SONODA NOBUO;GEMA WATARU
分类号 G01N27/22;G01N17/00;G01N27/02 主分类号 G01N27/22
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