发明名称 TESTER
摘要 A universal circuit board probe assembly 10 connects a variety of circuit board types to a diagnostic system 72. The probe assembly 10 is an integrated system which includes a general purpose perforate platform 12 having perforations 14 in a uniform grid pattern, a plurality of floating connector pins 110, 122 of the type having an opposing double-action movement, a removable backing plate 16 which confronts the platform 12, pin displacement modules 114, 116 which removably mount to the backing plate 16 and are disposed to abut to the connector pins 110, 122, means for aligning the backing plate with the platform and circuit board test points, means for urging the modules in contact with connector pins to activate the connector pins for testing, and means for causing the activated connector pins 110 to engage test points on a circuit board 106 to be tested.
申请公布号 JPS5796273(A) 申请公布日期 1982.06.15
申请号 JP19810162598 申请日期 1981.10.12
申请人 JIYON FURUUKU MFG CO INC 发明人 SUCHIIBUN EMU EBAARETSUTO
分类号 G01R31/02;G01R1/067;G01R1/073 主分类号 G01R31/02
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