Circuit provided with an exposure measuring part for sensor-controlled telemetry

摘要

A circuit for sensor-controlled distance measurement with two linear image sensors is disclosed. These sensors are exposed to lines corresponding to two images derived from one object. The sensor signals are subjected to correlation measurements, from which the range of the object is determined. An exposure-measuring circuit determines the optimum integration time of the sensor elements. A comparing sensor element of the exposure-measuring circuit is provided in a strip-shape and co-integrated on the semiconductor member. It is positioned for exposure to an optically generated charge quantity which corresponds to a plurality of sensor elements in at least one of the image sensors. The comparison sensor element is designed as a strip-shaped photodiode arranged next to the sensor element row in at least one of the image sensors. Above a zone of the semiconductor member between the sensor element row and the comparison sensor element a gate separated by a thin insulating layer is provided and which is subjected to a constant voltage.