| 摘要 |
PURPOSE:To test plural storage devices in a short time by sending a test start signal to test function circuits in the storage device simultaneously and receiving test normal completion report signals or test abnormal completion report signals from the test function circuits. CONSTITUTION:A system consists of a storage controller 2, a test diagnosis devoce 3 and a storage device 1-i, and a test control circuit 6 generates an address and test data and performs various control required to test respective storage devices. Then, a comparing circuit 7 compares a data pattern sent from the test control circuit 6 with data read out of a memory array circuit 5 to send an signal OK to the test control circuit 6 when the both are coincident with each other or a signal NOTOK to a fault processing circuit 8 when not. Further, the comparing circuit 7,when all comparison results are OK, outputs a test normal completion report signal, and the fault processing circuit 8, once receiving the signal NOTOK, holds a current address and a dissidence bit position, thereby outputting a test abnormal completion signal. |
