发明名称 MOS TRANSISTOR FORMED ALL BY IMPLANTATION AND METHOD OF PRODUCING SAME
摘要 A MOSFET structure having DMOS characteristics fabricated using all implantation only without the use of time-consuming diffusion. Particularly the critical length of the channel is controlled by beveling one edge of an oxide layer to a predetermined slope thereby allowing transferral of ions to the substrate through the beveled edge only to a predetermined depth thereof before being completely shielded. The result is a channel having a closely controlled length to thus be relatively very short for very fast switching of low or high voltage signals.
申请公布号 JPS5724568(A) 申请公布日期 1982.02.09
申请号 JP19810084886 申请日期 1981.06.02
申请人 XEROX CORP 发明人 RAMU ESU RONEN
分类号 H01L21/033;H01L21/266;H01L21/336;H01L29/10;H01L29/423;H01L29/78 主分类号 H01L21/033
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