发明名称 STORAGE TIME MEASURING APPARATUS FOR TRANSISTOR ELEMENT
摘要 PURPOSE:To measure the storage time easily and accurately by controlling a gate receiving a pulse output voltage of a transistor with pulses delayed in the sampling pulses at an equal time interval. CONSTITUTION:Sampling pulses are applied to a transistor Tr from a pulse generator circuit 1 while provided to a time regulator circuit 2. Delay pulses are generated at an equal time interval synchronizing the sampling pulses by said circuit 2, a check pulse width generator circuit 3, a delay circuit 4 and the like and control gates Q1...to which the pulse output of the transistor Tr. LEDs L1...light corresponding to respective storage times by way of FF'sF1...for recording states corresponding to gates Q1... With such an arrangement, the storage time of the transistor can be measured easily and accurately with less skill thereby enabling the selection of transistors, good or bad.
申请公布号 JPS5722571(A) 申请公布日期 1982.02.05
申请号 JP19800096818 申请日期 1980.07.17
申请人 TOHOKU METAL IND LTD 发明人 OOMIYA KENICHI
分类号 G01R31/26 主分类号 G01R31/26
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