发明名称 AUTOMATIC INSPECTION SYSTEM OF ELECTRONIC DEVICE
摘要 PURPOSE:To execute an inspection in a high speed and to simplify a hardware, by detaching an electronic device to be inspected, from a connecting and detaching circuit, in case of dissidence of a response signal from the electronic device to be inspected, and a correct answer data. CONSTITUTION:When an operator starts an inspection computer 8 by an input/ output console 10 and designates an inspection procedure, an inspection data is converted to that which is suitable for electronic devices to be inspected 61-6n from the inspection computer 8, is supplied to a connecting and detaching circuit 12, and is distributed to the electronic devices to be inspected 61-6n. The electronic devices to be inspected 61-6n execute a prescribed processing by use of the inspection data, supply a response signal of said result to the connecting and detaching circuit 12, take OR or AND of the response signal, and supply it to the inspection computer 8. The inspection computer 8 compares OR or AND of the response signal with a correct answer data, and in case of dissidence, detaches at least one electronic device to be inspected 61, and supplies a data for reinspection to the connecting and detaching circuit 12.
申请公布号 JPS5719849(A) 申请公布日期 1982.02.02
申请号 JP19800093280 申请日期 1980.07.10
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 ENDOU KEIICHI
分类号 G06F11/22;G06F11/273 主分类号 G06F11/22
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