| 摘要 |
PURPOSE:To measure a spectrum with high accuracy, by correcting the spectrum of measuring light on the basis of the inherent characteristic of a spectroscopic part calculated through a standard light source. CONSTITUTION:The light of a standard light source 20 is made incident to a spectroscopic part 1 through a mirror 22 and spectrally diffracted through a diffraction lattice 4 rotationally controlled by a control part 9 to be incident to a light detector 7. The output thereof is stored in a memory part 10 through an A/D converter part 8 and the spectrum data thereof is operationally processed by an inherent characteristic converting part 23 and the function T(omega) obtained by the Fourier transform of the inherent characteristic of the spectroscopic part 1 is calculated to be outputted to a divider part 12. The mirror 22 is removed and the light of a light source 21 to be measured is spectrally diffracted to obtain spectrum data which is, in turn, stored in the memory part 10. The function P(omega) obtained by the Fourier transform 11 of said data is divided by T(omega) by the divider part 12 and subjected to inverse Fourier transform by an inverse Fourier transform part 13 to display the spectrum corrected with respect to the inherent characteristic of the spectroscopic part 1 on a display part 14. |
