发明名称 PROBE OF NONCONTACTING ALTERNATING-CURRENT TYPE ELECTROMETER
摘要 PURPOSE:To obtain high precision by eliminating an error due to a contact potential difference by performing a chemical plating treatment after smoothing surfaces of metallic parts such as housing, oscillating electrodes, a detection electrode, and an electric-field shielding block. CONSTITUTION:Surfaces of metallic parts, such as housing 1, electric-field modulators 2 made of oscillating electrodes, a detection electrode 3, and an electric-field shielding block 4, are somoothed by lapping, etc., to the same state. Then, they are chemically plated with the same metal having a small tendency to ionization, e.g. gold and silver. A probe is formed by using thus treated metallic parts, so that no contact potential difference is developed among contact surfaces of the metallic parts. Thus, an error due to the contact potential difference is eliminated to improve the precision.
申请公布号 JPS56158961(A) 申请公布日期 1981.12.08
申请号 JP19800063048 申请日期 1980.05.13
申请人 RICOH KK 发明人 HASHIMOTO YOSHIO
分类号 G01R29/12;G01R29/08;(IPC1-7):01R29/12 主分类号 G01R29/12
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