发明名称 BIT ERROR TESTING METHOD
摘要 PURPOSE:To make a bit error test extremely highly efficient by forming the 1st and 2nd write/read gaps for high-density recording and low-density recording as one magnetic head in a manner as to array these on the same track. CONSTITUTION:A magnetic head 21 has the 1st write/read gap 22 for high-density recording and the 2nd write/read gap 23 for low-density recording integrally. Here, the 1st gap 22 positions on the inflow end side with respect to the flow A of a magnetic disc 11, and the 2nd gap 23 positions on the outflow end side. Both gaps are placed always on the same track. First, a bit error test is made with the 1st gap 22, and if it is accepted, the test by the 2nd gap 23 is not carried out and the test is shifted to the next track. In the case of reject, the gap is immediately switched to the 2nd gap 23 and the similar test is continued. In this way, the test by both high- and low recording densities is completed by one time of entire track scanning. Hence, with such constitution, the bit error test is made extremely highly efficient.
申请公布号 JPS56148737(A) 申请公布日期 1981.11.18
申请号 JP19800049145 申请日期 1980.04.16
申请人 FUJITSU LTD 发明人 SUENAGA TADATOSHI;MAEDA MIYOZOU
分类号 G11B5/84;G11B5/48;G11B20/18 主分类号 G11B5/84
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