发明名称 MEASURING METHOD OF CUT-OFF FREQUENCY OF WAVEGUIDE
摘要 PURPOSE:To obtain the cut-off frequency with high accuracy, by measuring three consecutive resonance frequencies. CONSTITUTION:The resonant wave number and measured waveguide length are erased from three consecutive resonance frequencies fr1, fr2, fr3 and the equation of in-tube wavelength, resonant wavelength and cut-off wavelength, and the cut-off frequency fc is obtained with equation. Thus, the objective measuring value can be obtained independently of the items of the length of waveguide length and resonant wave number.
申请公布号 JPS56129401(A) 申请公布日期 1981.10.09
申请号 JP19800033552 申请日期 1980.03.17
申请人 FURUKAWA ELECTRIC CO LTD 发明人 TANAKA MITSUGI;SUZUKI MITSUNORI
分类号 H01P1/00;G01R23/04;H01P3/12 主分类号 H01P1/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利