发明名称 Plasma etching of amorphous silicon (SE-35)
摘要 Amorphous silicon is selectively etched by concurrently exposing the silicon to a ionized plasma containing hydrogen and heating the silicon to a temperature of between about 150 DEG C. to about 350 DEG C. In one embodiment the selective etching technique is utilized to texture the surface of the amorphous silicon reducing the reflectivity thereof to less then about 5%.
申请公布号 US4285762(A) 申请公布日期 1981.08.25
申请号 US19790108417 申请日期 1979.12.31
申请人 EXXON RESEARCH & ENGINEERING CO. 发明人 MOUSTAKAS, THEODORE D.
分类号 H01L21/3213;H01L31/0236;(IPC1-7):H01L21/30 主分类号 H01L21/3213
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