| 摘要 |
PURPOSE:To perform highly-precise measurement of the change in the state of a sample caused by perturbation by a method wherein X-rays having a pulse-form continuous wavelength are applied to the sample and scattered to form a one-dimensional absorption spectrum image and are detected for each pulse thereof by an SSPA detector. CONSTITUTION:The divergent X-rays 3 given by an X-ray tube 2 pass the sample in a holder 4, are scattered angularly into the respective wavelength in accordance with the incident angle thereof at a spectral crystal 5, are sent to the SSPA detector 6 as the one-dimensional X-ray absorption spectrum image, are transduced into the charge quantity in each single photodiode of SSPA, and are read out as an analog quantity by a scanning circuit. The data thus obtained, passing through a control circuit 8, are sent to a processing device controlled by a timing circuit 11 and, stored there once, are subjected to operational processing. Accordingly, by continuous and repeated application of the divergent X-rays 3, the change in the state of the sample caused by the perturbation can be followed and thus highly-precise measurement can be performed. |
