发明名称 PULSE TRAIN TESTING DEVICE
摘要 PURPOSE:To realize a small size of the testing device as well as ensure the simple extraction of the desired pulse train, by providing plural units of the two-string pulse testing circuits which correspond to the variation mode of the repetitive frequency of the input pulse. CONSTITUTION:Input pulse 1 is supplied to memory 23 which can read and write freely with synchronism 2 given. At the same time, the address line of address counter 24 which has the free running in the fixed cycle T-(DELTAT/2) is connected to memory 23. Then FF26 is set by reading information 25 of memory 23, and at the same time measuring circuit 27 is actuated for a fixed time. Thus FF26 is reset with the output of circuit 27, and gate pulse 28 which has constant time interval DELTAT and rises up by information 25 in the form of the output of FF26 is delivered. Then AND 29 is secured between pulses 28 and 1 to obtain output 30 of two-string pulse testing circuit 13. In other words, the pulse train of an optional repetitive interval T can be extracted by setting previously both cycle T-(DELTAT/2) of counter 24 in circuit 13 and constant time DELTAT of circuit 27 to the desired value each.
申请公布号 JPS5613828(A) 申请公布日期 1981.02.10
申请号 JP19790089598 申请日期 1979.07.13
申请人 MITSUBISHI ELECTRIC CORP 发明人 MAEDA TOSHIO
分类号 H03K5/19;G01R23/15;G01S7/38;H03K5/153 主分类号 H03K5/19
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