发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain the epitaxial active layer having fewer defects such as dislocation by a method wherein etch-pits are caused to be appeared, the part including fewer etch-pits is cut off selectively, and epitaxial growth is made on thus obtained substrate. CONSTITUTION:After etching the surface of a substrate to be used for epitaxial growth so as to make etch-pits appeared, the part of the substrate with low density of etch-pits is cut off selectively and visually. When the etch-pits are small and shallow, the forms of the etch-pits are removed through the etching by mirror abrasive liquids and then epitaxial growth is made directly. When the etch-pits are large and deep, epitaxial growth is made after performing melt-back, for example. Furthermore, in some cases epitaxial growth is made after developing a buffer layer.
申请公布号 JPS5591814(A) 申请公布日期 1980.07.11
申请号 JP19780164808 申请日期 1978.12.28
申请人 FUJITSU LTD 发明人 NAKAJIMA KAZUO
分类号 H01L21/20;H01L21/205;H01L21/302;H01L21/306;H01L31/00;H01L31/107;H01L33/12;H01L33/30;H01S5/00 主分类号 H01L21/20
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