| 摘要 |
In an arrangement for the synthetic testing of high-voltage circuit breakers, in which a first breaking point (1a) is in the high-voltage circuit and in the high-current circuit, the other breaking points (1b, 1c) are connected in series with the first breaking point (1a), with or without parallel spark gap (15), in the high-current circuit. The circuit arrangement can thus be simplified with respect to its test arrangement elements. <IMAGE>
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