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发明名称
TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS UNIT
摘要
申请公布号
JPS5578262(A)
申请公布日期
1980.06.12
申请号
JP19780152247
申请日期
1978.12.08
申请人
MITSUBISHI ELECTRIC CORP
发明人
YAMAMOTO KENICHI
分类号
G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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