发明名称 Elevation sampling terrain probe
摘要 A surface contour sampling system is disclosed which intermittently measures the elevational irregularities in various and sundry surfaces, including those of the earth's terrain, model boards, and the like, with respect to a predetermined datum plane. A unique rotating bell crank and stepping surface sensing sampler combination permits the stepping upon and/or over large sloping or elevational changes by said surface sensing sampler, including those that are normal to the surface trend at any given location, without being stopped thereby, as it is moved forward along a predetermined path thereon by a suitable carrier vehicle.
申请公布号 US4158258(A) 申请公布日期 1979.06.19
申请号 US19780899194 申请日期 1978.04.24
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 MCKECHNIE, JOHN C.
分类号 G01B7/28;G01C7/04;(IPC1-7):G01B7/34 主分类号 G01B7/28
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