发明名称 Method for photolithographic pattern generation in a photoresist layer.
摘要 <p>With the method, in which the photoresist is exposed to radiation more than once, a hole pattern corresponding to the pattern of openings (15, 16) of an exposure mask (14) as well as a hole pattern corresponding to the negative of the pattern of openings (28, 29, 30) of another exposure mask (25) are sequentially produced ink a single photoresist layer (12). The method is used e.g. in forming holes (23, 24) defined by the positive image into an oxide layer (11) on a substrate (10), and in producing a metallization pattern (36a, 36b) defined by the negative image for interconnecting areas of the substrate (10).</p>
申请公布号 EP0072933(A1) 申请公布日期 1983.03.02
申请号 EP19820106777 申请日期 1982.07.27
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABRAHAMOVICH, KAREN MARIE;HAMEL, CLIFFORD JOSEPH;PAYNE, EDWARD HENRY;WEED, DEAN ROBERT
分类号 H01L21/30;G03F7/00;G03F7/20;G03F7/26;H01L21/027;H01L21/306;(IPC1-7):01L21/312;03F7/26;01L21/308 主分类号 H01L21/30
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