发明名称 Advanced CMOS circuitry that utilizes both sides of a wafer surface for increased circuit density
摘要 An integrated circuit employing both sides of a base substrate or wafer and a method of making the same are provided. In one aspect, the integrated circuit includes a base substrate that has a first side and a second side opposite the first side. The first side has a first semiconductor layer and a first isolation structure positioned thereon wherein the first side surrounds the first semiconductor layer. The second side has a second semiconductor layer and a second isolation structure positioned thereon wherein the second isolation structure surrounds the second semiconductor layer. A first circuit device is positioned on the first semiconductor layer. A second circuit device is positioned on the second semiconductor layer. The method enables simultaneous processing of both sides of a given wafer. Fabrication efficiency is increased through higher throughput and much higher yields per wafer.
申请公布号 US6150708(A) 申请公布日期 2000.11.21
申请号 US19980191305 申请日期 1998.11.13
申请人 ADVANCED MICRO DEVICES, INC. 发明人 GARDNER, MARK I.;FULFORD, H. JIM;MAY, CHARLES E.
分类号 H01L21/822;H01L27/06;H01L27/092;(IPC1-7):H01L25/00 主分类号 H01L21/822
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