发明名称 ATOMIC FORCE MICROSCOPE UNIT
摘要 PURPOSE:To obtain an atomicforce microscope (AFM) unit which can be incorporated into an optical microscope which is available on the market by installing a coupling part which is coupled to the optical microscope so as to be freely detachable. CONSTITUTION:A base 2 is provided with a coupling part 16 which is used to attach an AFM unit to an optical microscope in a position directly under a sample holder 4 on its bottom face. The coupling part 16 has a structure corresponding to the stage mounting part of a substage. When the optical microscope is to be used as an ordinary optical microscope, a unit frame 5 is lowered, and a cantilever holder 7 is detached. In this state, a sample S which is held by the sample holder 4 is observed by an objective lens 101. After that, when the sample is to be observed by the AFM unit, the unit frame 5 is raised, and the catilever holder 7 is mounted in the central hole of the unit frame 5. In addition, an incidence-side reflecting mirror 11 is moved directly above a cantilever 6. By this operation only, the sample can be observed by the AFM unit.
申请公布号 JPH0854404(A) 申请公布日期 1996.02.27
申请号 JP19940188449 申请日期 1994.08.10
申请人 NIKON CORP 发明人 SATO KENICHI
分类号 G01B21/30;G01N37/00;G01Q20/02;G01Q30/02;G01Q60/24;H01J37/28;(IPC1-7):G01N37/00 主分类号 G01B21/30
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