| 摘要 |
The disclosure relates to LSSD systems for use in digital computers and the like. More particularly, to an organization of logic in such systems to render the clock networks testable with minimal overhead. The advantages of the practice of the invention are particularly apparent and enhanced when the invention is employed in a Level Sensitive Scan Design (LSSD) System generally of the type disclosed in U.S. Pat. No. 3,783,254 and U.S. patent application Ser. No. 701,052, filed June 30, 1976. |
