首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
STEL MAATLEPELS.
摘要
申请公布号
NL7705795(A)
申请公布日期
1977.12.28
申请号
NL19770005795
申请日期
1977.05.26
申请人
DART INDUSTRIES INC. TE LOS ANGELES, CALIFORNEE, VER.ST.V.AM.
发明人
分类号
A47G21/02;G01F19/00;(IPC1-7):G01F19/00
主分类号
A47G21/02
代理机构
代理人
主权项
地址
您可能感兴趣的专利
DISPLAY PANEL, DISPLAY PANEL MODULE, AND ELECTRONIC APPARATUS
TFT ARRAY INSPECTION METHOD AND TFT ARRAY INSPECTING DEVICE
ENGAGING MEMBER, LENS DRIVING MECHANISM, IMAGING APPARATUS, AND MANUFACTURING METHOD OF ENGAGING MEMBER
ELECTRO-OPTICAL APPARATUS AND ELECTRONIC APPARATUS
CHARGING DEVICE AND IMAGE FORMING DEVICE
ACTUATOR, OPTICAL SCANNER, AND IMAGE FORMING APPARATUS
CURL PREVENTING APPARATUS AND IMAGE FORMING APPARATUS
MANUFACTURING DEVICE, METHOD AND DRYER FOR COATING FILM, AND OPTICAL FILM
IMAGING LENS, CAMERA MODULE AND IMAGING EQUIPMENT
METHOD FOR MEASURING TRACE CHEMICAL SUBSTANCE AND ITS APPARATUS
DEVICE AND SYSTEM FOR DISPLAYING ENVIRONMENTAL VALUE INFORMATION
METHOD OF DETECTING CRACK OF SINTERED MECHANICAL COMPONENT
DEVICE FOR MEASURING PARTICLE CONCENTRATION
MEASURING GAUGE EQUIPPED WITH DIAL PLATE HAVING GRADATION LAYERS FORMED
DESTRUCTIVE TESTING METHOD OF MOBILE ELECTRONIC EQUIPMENT
DISPOSAL MEASURING TAPE
ATOMIC FORCE MICROSCOPE SYSTEM
POSITION-DETECTING DEVICE AND POSITION-DETECTING METHOD
MICROARRAY DEVICE AND MICROARRAY ANALYSIS METHOD
FATIGUE CRACK SIMULATION AND METHOD FOR ESTIMATING RESIDUAL LIFE OF STRUCTURE
