发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a transistor with small parasitic capacity.SOLUTION: A manufacturing method for a semiconductor device comprises: forming a first insulator, a first oxide semiconductor, and a first conductor; forming a second conductor by processing the first conductor; forming a second oxide semiconductor by processing the first oxide semiconductor; forming a second insulator on the second conductor; forming a third insulator on the second insulator; forming a fourth insulator on the third insulator; exposing a part of the third insulator by processing selectively the fourth insulator; exposing a part of the second insulator by processing selectively the exposed third insulator; exposing a part of the second conductor by processing selectively the exposed second insulator; exposing a part of the second oxide semiconductor by processing selectively the exposed second conductor; forming a fifth insulator on the second oxide semiconductor and the fourth insulator; forming a third conductor on the fifth insulator; and performing chemical mechanical polishing to expose an upper surface of the fourth insulator.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016149546(A) |
申请公布日期 |
2016.08.18 |
申请号 |
JP20160019795 |
申请日期 |
2016.02.04 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
OKAZAKI YUTAKA |
分类号 |
H01L29/786;G02F1/1368;H01L21/336;H01L21/8234;H01L21/8242;H01L27/06;H01L27/08;H01L27/088;H01L27/10;H01L27/108;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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