首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
EVALUATING METHOD FOR OXIDE CONTAMINATION OF SEMICONDUCTOR WAFERS
摘要
申请公布号
JPS52102679(A)
申请公布日期
1977.08.29
申请号
JP19760018968
申请日期
1976.02.25
申请人
HITACHI LTD
发明人
ISHII SEIICHI
分类号
H01L21/66;H01L21/316
主分类号
H01L21/66
代理机构
代理人
主权项
地址
您可能感兴趣的专利
HEMOGLOBIN COMPOSITIONS
ELECTROMAGNETIC CLUTCH
TEST APPARATUS AND TEST METHOD
SYSTEM AND METHOD FOR ESTIMATING LONG TERM CHARACTERISTICS OF BATTERY
SOLID POWDER FORMULATIONS FOR THE PREPARATION OF RESIN-COATED FOILS AND THEIR USE IN THE MANUFACTURE OF PRINTED CIRCUIT BOARDS
NONVOLATILE MEMORY ELEMENT AND NONVOLATILE MEMORY DEVICE INCORPORATING NONVOLATILE MEMORY ELEMENT
Spherical joint with internal brake
MEMBRANE HOLDER
Inkjet ink compositions comprising modified pigments
MEDIA BRIDGE APPARATUS AND METHODS
METHOD AND SYSTEM FOR TRAFFIC BASED DECISIONS FOR ENERGY EFFICIENT NETWORKING
AUTOMATIC APPARATUS FOR LOADING AND UNLOADING BIOLOGICAL MATERIAL TEST TUBES IN A PNEUMATIC MAIL SYSTEM
Blood pressure cuff
STRUCTURED LAYER DEPOSITION ON PROCESSED WAFERS USED IN MICROSYSTEM TECHNOLOGY
NON-TARGET AMPLIFICATION METHOD FOR DETECTION OF RNA SPLICE-FORMS IN A SAMPLE
PUPICIDAL AND LARVICIDAL COMPOSITION
APPLICATOR FOR COMBING THE EYELASHES OR THE EYEBROWS OR FOR APPLYING A COMPOSITION THERETO
DEVICE FOR MULTICAST OF OPTICAL SIGNALS IN THE INTERNET AND OTHER NETWORKS
Optical device
METHOD OF DETERMINATION OF GLASS SURFACE SHAPES AND OPTICAL DISTORTION BY REFLECTED OPTICAL IMAGING