发明名称 XXRAY SPECTROMETER
摘要 PURPOSE:To provide a X-ray spectrometer, comprising means for linear driving of wavelength, so that relationship between intensity of X-rays and wavelength can be directly detected and it is enabled to indicate intensity of X-rays at uniform intervals of wavelength (linear scanning of wavelength).
申请公布号 JPS5292777(A) 申请公布日期 1977.08.04
申请号 JP19760009569 申请日期 1976.01.30
申请人 SHIMADZU CORP 发明人 SHIMOMURA TEIICHI
分类号 G01N23/22;G01N23/201;G21K1/06 主分类号 G01N23/22
代理机构 代理人
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