发明名称 HALBLEITERBAUELEMENT UND VERFAHREN ZU SEINER HERSTELLUNG
摘要 An oxygen or nitrogen ion beam is implanted into a polycrystalline silicon or in an amorphous silicon layer, or a single crystal device body or layer, on a semiconductor substrate to an extent sufficient to convert the polycrystalline silicon layer, the amorphous layer or the single crystal device body or layer into a semi-insulating layer having a resistivity of 107 to 1011 ohm-cm, which has improved passivation property.
申请公布号 DE2617397(A1) 申请公布日期 1976.11.04
申请号 DE19762617397 申请日期 1976.04.21
申请人 SONY CORP. 发明人 AOKI,TERUAKI;MATSUSHITA,TAKESHI;MIFUNE,TADAYOSHI;HAYASHI,HISAO
分类号 H01L27/04;H01L21/00;H01L21/265;H01L21/314;H01L21/316;H01L21/318;H01L21/329;H01L21/331;H01L21/76;H01L21/822;H01L23/29;H01L23/31;H01L29/73;H01L29/78;H01L29/8605;(IPC1-7):H01L21/265 主分类号 H01L27/04
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