| 摘要 |
<p>The simple method is for applying redundancy techniques in the construction of large semiconductor storage tanks so that a certain number of faulty elements can be accommodated. Techniques of this kind allow a significant improvement in the proportion of usable storage blocks manufactured. A brief study of the likelihood of more than one faulty element occurring in a storage block is given, using a binominal expansion technique, and a method described whereby an address line (AO-P) to a set of storage blocks (SB1, SB2 ... SBN) can be interrogated and inverted (AO-N) if any faulty element in that address is discovered. This address is different elements for the same external address. A simple interruption of a printed circuit (6) and its replacement with a link (5) is all that is needed for this operation.</p> |
