| 摘要 |
PURPOSE:To prevent damage and an erroneous decision to be generated when an electronic parts to be tested is inserted erroneously in a tester by a method wherein an insertion deciding circuit to decide correction of inserting condition of the electronic parts to be tested is furnished to the tester to test the electronic parts to be tested being inserted detachably in a socket. CONSTITUTION:The LSI1 to be tested is inserted in the socket 2, and when a switch 3 is closed to apply a test start indication, the insertion deciding circuit 7 makes an electric power source 6 to ON to apply a voltage to the LSI1 to be tested through the socket 2. After the prescribed test time, the insertion deciding circuit 7 makes the electric power source 6 to OFF, and takes in a response to decide correction of insertion. The result thereof is indicated on an indicating circuit 4. When the parts is erroneously inserted, the parts is newly inserted over again to be tested by a test deciding circuit 5. Accordingly voltage applying time to the LSI to be tested is made as the necessary shortest time to prevent damage and the erroneous decision to be generated when the parts is erroneously inserted. |
