发明名称 CIRCUIT AND METHOD FOR MEASURING A CURRENT
摘要 Circuits, switches with over-current protection and methods for measuring a current are described herein. A circuit configured to provide a current from a supply voltage to a load includes a first transistor, a second transistor, and a detecting circuit. The first transistor has a larger active area than the second transistor. The detecting circuit is configured to detect a current through the second transistor. A same voltage is applied between a control terminal of the first transistor and a first controlled terminal of the first transistor and is applied between a control terminal of the second transistor and a first controlled terminal of the second transistor. The detecting circuit is coupled to the second controlled terminal of the second transistor and is coupled to the supply voltage.
申请公布号 US2016164279(A1) 申请公布日期 2016.06.09
申请号 US201414564172 申请日期 2014.12.09
申请人 Infineon Technologies AG 发明人 Asam Michael;Meiser Andreas;Thiele Steffen
分类号 H02H9/02;G01R19/165;H03K19/0185 主分类号 H02H9/02
代理机构 代理人
主权项 1. A circuit, configured to provide a current from a supply voltage to a load, comprising: a first transistor; a second transistor; and a detecting circuit configured to detect a current through the second transistor; wherein the first transistor has a larger active area than the second transistor; wherein a same voltage is applied between a control terminal of the first transistor and a first controlled terminal of the first transistor and is applied between a control terminal of the second transistor and a first controlled terminal of the second transistor; wherein the detecting circuit is coupled to the second controlled terminal of the second transistor; and wherein the detecting circuit is coupled to the supply voltage.
地址 Neubiberg DE