发明名称 |
CIRCUIT AND METHOD FOR MEASURING A CURRENT |
摘要 |
Circuits, switches with over-current protection and methods for measuring a current are described herein. A circuit configured to provide a current from a supply voltage to a load includes a first transistor, a second transistor, and a detecting circuit. The first transistor has a larger active area than the second transistor. The detecting circuit is configured to detect a current through the second transistor. A same voltage is applied between a control terminal of the first transistor and a first controlled terminal of the first transistor and is applied between a control terminal of the second transistor and a first controlled terminal of the second transistor. The detecting circuit is coupled to the second controlled terminal of the second transistor and is coupled to the supply voltage. |
申请公布号 |
US2016164279(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201414564172 |
申请日期 |
2014.12.09 |
申请人 |
Infineon Technologies AG |
发明人 |
Asam Michael;Meiser Andreas;Thiele Steffen |
分类号 |
H02H9/02;G01R19/165;H03K19/0185 |
主分类号 |
H02H9/02 |
代理机构 |
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代理人 |
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主权项 |
1. A circuit, configured to provide a current from a supply voltage to a load, comprising:
a first transistor; a second transistor; and a detecting circuit configured to detect a current through the second transistor; wherein the first transistor has a larger active area than the second transistor; wherein a same voltage is applied between a control terminal of the first transistor and a first controlled terminal of the first transistor and is applied between a control terminal of the second transistor and a first controlled terminal of the second transistor; wherein the detecting circuit is coupled to the second controlled terminal of the second transistor; and wherein the detecting circuit is coupled to the supply voltage. |
地址 |
Neubiberg DE |