发明名称 SCANNING ELECTRON BEAM COMPUTED TOMOGRAPHY SCANNER WITH ION AIDED FOCUSING
摘要 <p>An electron beam production and control assembly especially suitable for use in producing X-rays in a computed tomography X-ray scanning system is disclosed herein. In this system, an electron beam is ultimately directed onto an X-ray producing target in a converging manner using electromagnetic components to accomplish this. The system also includes an arrangement for neutralizing the converging beam in a controlled manner sufficient to cause it to converge to a greater extent than it otherwise would in the absence of controlled neutralization, whereby to provide ion aided focusing.</p>
申请公布号 CA1207920(A) 申请公布日期 1986.07.15
申请号 CA19840447452 申请日期 1984.02.15
申请人 IMATRON INC. 发明人 RAND, ROY E.
分类号 H01J35/30;A61B6/03;H01J35/00;H01J35/14;H05G1/52;(IPC1-7):H05G1/00 主分类号 H01J35/30
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