发明名称 SYSTEMS AND METHODS FOR OSCILLATING EXPOSURE OF A SEMICONDUCTOR WORKPIECE TO MULTIPLE CHEMISTRIES
摘要 <p>Systems and methods for oscillating exposure of a semiconductor workpiece to multiple chemistries are disclosed. A method in accordance with one embodiment includes sequentially exposing a portion of a semiconductor workpiece surface to a first chemistry having a first chemical composition and a second chemistry having a second chemical composition different than the first. Prior to rinsing the portion of the workpiece surface, the portion is sequentially exposed to the first and second chemistries again. The first and second chemistries are removed from the portion, and, after sequentially exposing the portion to each of the first and second chemistries at least twice, and removing the first and second chemistries, the portion is rinsed and dried.</p>
申请公布号 WO2008156963(A1) 申请公布日期 2008.12.24
申请号 WO2008US64589 申请日期 2008.05.22
申请人 MICRON TECHNOLOGY, INC.;ANDREAS, MICHAEL 发明人 ANDREAS, MICHAEL
分类号 H01L21/00;H01L21/306 主分类号 H01L21/00
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