发明名称 FOUR OPENER
摘要 PROBLEM TO BE SOLVED: To provide a FOUP opener where contaminations, generated from a sensor mechanism for detecting a semiconductor wafer received in the FOUP, are isolated from a wafer, the sensor mechanism is made compact, the footprint of the opener is made small, and the cost performance and yield are high. SOLUTION: In a FOUP opener 1 comprising at least a pot door 23 that has an attachment and detachment mechanism and a holding mechanism which a FOUP door 13 is attached/detached and held, a port door advance or retreat mechanism 40 for moving the port door 23 horizontally, and a port door up- down mechanism 50 for moving the port door 23 perpendicularly, a sensor advance or retreat mechanism 60 is provided at an up-down base member 51 of the port door up-down mechanism 50, a sensor securing member 62 is provided so as to elongate in the upward direction at the sensor advance or retreat mechanism 60, and a transmissive optical sensor 70 or a mapping sensor for detecting the existence, a stored state, and a stored position (height) of the wafer 14 in the FOUP is installed in the upper part of the sensor installing member 62.
申请公布号 JP2002164411(A) 申请公布日期 2002.06.07
申请号 JP20010269149 申请日期 2001.09.05
申请人 HIRATA CORP 发明人 HARUKAWA SUMIO;YOKOYAMA SHINJI
分类号 B65G49/00;B65G49/07;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B65G49/00
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