发明名称 SEMICONDUCTOR MANUFACTURING DEVICE
摘要 PROBLEM TO BE SOLVED: To realize stable film formation by stabilizing film formation conditions and surely prevent leakage of CVD gas from a semiconductor manufacturing device in a semiconductor manufacturing device for forming a film in a semiconductor substrate by a CVD method. SOLUTION: Shutters 6a, 6b, which can be opened and closed independently, are provided to a load part 6. A normal pressure chemical gas growth processor 8 is disposed with an inlet 8a adjacent to the shutter 6b. An unload part 7 having shutters 7a, 7b which can be opened and closed independently is disposed with the shutter 7a adjacent to an outlet 8b of the processor 8.
申请公布号 JP2002261089(A) 申请公布日期 2002.09.13
申请号 JP20010061542 申请日期 2001.03.06
申请人 SONY CORP 发明人 TSUCHIYA SHINJI
分类号 C23C16/44;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/44
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