发明名称 半導体装置の配線構造及びその製造方法
摘要 A wiring structure of a semiconductor device, includes: an insulating layer formed on a base member; a first metal layer covered with the insulating layer; a second metal layer having a plurality of electrode parts which are arranged on the insulating layer to be spaced from each other and which have a thickness larger than the first metal layer, the insulating layer having a plurality of via holes which connect the first metal layer and the plurality of electrode parts; and a plurality of through wiring lines which are located within the plurality of via holes and which electrically connect the plurality of electrode parts to the first metal layer.
申请公布号 JP5922331(B2) 申请公布日期 2016.05.24
申请号 JP20110020489 申请日期 2011.02.02
申请人 ラピスセミコンダクタ株式会社 发明人 沼口 浩之
分类号 H01L21/60;H01L21/3205;H01L21/768;H01L23/522 主分类号 H01L21/60
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