发明名称 METHOD FOR THE NON-DESTRUCTIVE TEST OF SURFACE DEFECTS
摘要 <p>In a method for the non-destructive test of surface defects, there is applied to the surface a solution with one or a plurality of dyes which do not emit any radiation under the effect of ultra-violet light. The solution in excess after penetration of the latter into the surface defects is wiped away and the surface is covered with a day light-sensitive developer layer which contains from 0.02 to 2.0% by weight of one or a plurality of clearing agents. The coating layer absorbs the colour remaining in the surface defects which appear as black traces under the effect of ultra-violet light.</p>
申请公布号 WO1985002464(A1) 申请公布日期 1985.06.06
申请号 EP1984000362 申请日期 1984.11.16
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