发明名称 SCAN TYPE TUNNEL EFFECT MICROSCOPE
摘要 This scanning tunneling microscope consists of a semiconductor chip (7) into which slots are etched to form a central portion (1) linked by a first pair of stripes (2, 3) to an intermediate portion (4) which in turn is linked by a second pair of stripes (5, 6) to the main body of the chip (7). The pairs of stripes (2, 3; 5, 6) have mutually orthogonal directions to allow the center portion (1) to perform movements in x- and y-directions under the control of electrostatic forces created between the stripes (2, 3; 5, 6) and their opposite walls. The center portion (1) has formed into it at least one tongue (17) carrying an integrated, protuding tunnel tip (18) which is capable of being moved in z-direction by means of electrostatic forces between said tongue (17) and the bottom of a cavity below the tongue (17).
申请公布号 JPS61206148(A) 申请公布日期 1986.09.12
申请号 JP19850271734 申请日期 1985.12.04
申请人 INTERNATL BUSINESS MACH CORP 发明人 JIEEMUZU KAJIMIAZU JIMUZEUSUKII;BUORUFUGANKU DEITERU POORU
分类号 H01J37/28;B81B3/00;G01B7/34;G01N23/00;G01N27/00;G01Q10/04;G01Q30/04;G01Q30/18;G01Q30/20;G01Q60/10;G01Q60/16;G01Q70/02;G01Q70/06;G01Q70/18;H01J37/20;H04R19/00 主分类号 H01J37/28
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