发明名称 CIRCUITRY FOR RELIABILITY TESTING AS A FUNCTION OF SLEW
摘要 A reliability test chain includes: a stress chain; and transition time control circuits coupled to tap points along the stress chain such that transition times of a signal on the stress chain are controlled.
申请公布号 US2008089126(A1) 申请公布日期 2008.04.17
申请号 US20060536884 申请日期 2006.09.29
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 MARSHALL ANDREW;PITTS ROBERT L.
分类号 G11C16/04 主分类号 G11C16/04
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